BQ7720700DSSR
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In the Texas Instruments bq77207, an internal delay timer is initiated upon detection of an overvoltage, undervoltage, open-wire, or overtemperature condition. Upon expiration of the delay timer, the respective output is triggered into its active state (high or low, depending on the configuration).
The overvoltage triggers the COUT pin if a fault is detected, and undervoltage triggers the DOUT pin if a fault is detected. If an overtemperature or open-wire fault is detected, both the DOUT and COUT will be triggered. The bq77207 device provides a Customer Test Mode (CTM) with significantly reduced delay time for quicker production-line testing.