BQ7721610PWR
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In the Texas Instruments bq77216 device, an internal delay timer is initiated upon detection of an overvoltage, undervoltage, open-wire, or overtemperature condition. Upon expiration of the delay timer, the respective output is triggered into its active state, either high or low, depending on the configuration.
The overvoltage triggers the COUT pin if a fault is detected, and undervoltage triggers the DOUT pin if a fault is detected. If an overtemperature or open-wire fault is detected, then both the DOUT and COUT will be triggered. For quicker production-line testing, the Texas Instruments bq77216 device provides a Customer Test Mode (CTM) with greatly reduced delay time.